A scheme of the deformation-induced shear transformation in nanocrystalline cobalt is proposed. follows from XRD analysis that cobalt oxide Co 3 O 4 is the main crystallographic phase in the oxidized form of the prepared catalysts, Figure 1. The XRD pattern of cobalt oxide nanoparticles was represented in Fig. Diffraction patterns can be obtained from a randomly. The XRD pattern of cobalt oxide nanoparticle were compared and interpreted with standard data of JCPDS file (JCPDS international center for diffraction data, 1991). The X- ray diffraction pattern has a major peak of (3 1 1) at 37°. When decreasing the sizes of Co, Cu, and Ni crystallites in the course of MA to 30, 77, and 60 nm respectively, the maximum G are observed, which is a consequence of deformation by the mechanism of the generation of partial Shockley dislocations by nanograin boundaries and their sliding in the grain body with the formation of SF. X-ray diffraction techniques are used for the identification of crystalline phases of various materials and the quantitative phase analysis subsequent to. Every crystalline phase of a given substance produces a characteristic X-ray diffraction pattern. CoSi was synthesized by isothermal reaction of the elements cobalt (powder Alfa Aesar 99.998) and silicon (powder Alfa Aesar 99.999) in the presence of. The increased G for nanocrystalline nickel is associated with the effect of impurities. The values of the energy yields of stacking faults (G) upon MA for nanocrystalline Co and Cu are in agreement with the values of for these metals in the coarse crystalline state (the lower the, the higher the G). The amount of material needed for a diffraction pattern depends on the diffracting power of. The study was performed to understand the connection of the evolution mentioned with plastic deformation mechanisms and depending on grain size. X-Rays are produced by a 1.8 kW, Cobalt target, sealed tube. Abstract : The evolution of stacking faults (SF) during the mechanical activation (MA) of metals with a different energy of SF (): Co (7 mJ/m.sup.2), Cu (45 mJ/m.sup.2), Ni (125 mJ/m.sup.2),-was studied by X-ray diffraction analysis using (i) a complex for processing diffraction patterns and (ii) simulation of crystal diffraction patterns (DIFFaX).
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